Workstation
By Design News Staff -- Design News, April 6, 1998
FIB 200xP focused ion beam workstation is for R&D, failure analysis, design verification, and surface science. Equipped with a high-stability 5-axis tilt-eucentric stage, the FIB 200xP provides on-target navigation and specimen manipulation across specimens up to 50 x 50 mm, and handles various samples such as packaged semiconductor parts, wafer sections, and circuit boards. Data sheet highlights the FIB technology and the workstation's intuitive operation and control.
FEI Co., 7451 N.W. Evergreen Pkwy., Hillsboro, OR 97124, FAX (503) 640-7509.
Talkback
DN's Resource Center Get Free Information, Made Easy
-
Understanding a Modular Instrumentation System for Automated Test
National Instruments | White Paper
Request Item -
Advanced Features of High Speed Digital I/O devices : White Paper Series
National Instruments | White Paper
Request Item
















